Fabrication and modeling of a combined gold nanoparticle-carbon nanotube single electron transistor

Summary, in English

Scanning probe manipulation has been used to electrically connect two carbon nanotubes to an individual 7 nm gold particle, resulting in a system with multiple tunnel junctions. Single-electron charging effects in the gold particle was found to dominate the electrical transport measurements at T=4.2 K, whereas charging effects in the two carbon nanotube leads appeared as a fine structure. A simulation of the electrical transport in the system has been carried out using SIMON*, which is a Monte Carlo based simulation program for single-electronics. Using this program we have been able to fit a model to the experimental data and to explain the electrical transport characteristics

• Författare: Claes Thelander; Martin Magnusson; Knut Deppert; Lars Samuelson; P.R. Poulsen; J. Nygard; J. Borggreen
• Avdelning/ar: Fasta tillståndets fysik
• Publiceringsår: 2002
• Språk: Engelska
• Publikation/Tidskrift/Serie: 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science
• Dokumenttyp: Konferensbidrag
• Förlag: Lund University
• Ämne: Condensed Matter Physics
• Nyckelord: electrical transport measurements; single electron charging effects; multiple tunnel junctions; electrical contacts; scanning probe manipulation; transistor modelling; transistor fabrication; single electron transistor; gold nanoparticle; carbon nanotube; fine structure; simulation of nanostructures; Monte Carlo based simulation; 7 nm; 4.2 K; Au-C
• Conference name: Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
• Conference date: 2002-06-24 - 2002-06-28
• Conference place: Malmö, Sweden
• Status: Published